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[IEEE International Test Conference - Baltimore, MD, USA (30 Oct.-1 Nov. 2001)] Proceedings International Test Conference 2001 (Cat. No.01CH37260) - A new methodology for improved tester utilization

✍ Scribed by Khoche, A.; Kapur, R.; Armstrong, D.; Williams, T.W.; Tegethoff, M.; Rivoir, J.

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