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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - X-tolerant compression and application of scan-atpg patterns in a bist architecture

✍ Scribed by Wohl, P.; Waicukauski, J.A.; Patel, S.; Amin, M.B.

Book ID: 125815426
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 944 KB
Volume: 1
Category: Article
ISBN-13: 9780780381063
DOI: 10.1109/TEST.2003.1270902

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