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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Cost-effective approach for reducing soft error failure rate in logic circuits

✍ Scribed by Mohanram, K.; Touba, N.A.

Book ID: 115445941
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 902 KB
Volume: 1
Category: Article
ISBN-13: 9780780381063
DOI: 10.1109/test.2003.1271075

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