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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Atpg padding and ate vector repeat per port for reducing test data volume

✍ Scribed by Vranken, H.; Hapke, F.; Rogge, S.; Chindamo, D.; Volkerink, E.

Book ID: 120846778
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 1007 KB
Volume: 1
Category: Article
ISBN-13: 9780780381063
DOI: 10.1109/TEST.2003.1271095

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