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[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Subband structure engineering for performance enhancement of Si MOSFETs

✍ Scribed by Takagi, S.; Koga, J.; Toriumi, A.

Book ID: 120572332
Publisher: IEEE
Year: 1997
Weight: 421 KB
Edition: 1997
Category: Article
ISBN-13: 9780780341005
DOI: 10.1109/IEDM.1997.650345

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