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[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Hot-carrier reliability in submicrometer LDMOS transistors

✍ Scribed by Versari, R.; Pieracci, A.; Manzini, S.; Contiero, C.; Ricco, B.

Book ID: 120214049
Publisher: IEEE
Year: 1997
Weight: 356 KB
Edition: 1997
Category: Article
ISBN-13: 9780780341005
DOI: 10.1109/IEDM.1997.650402

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