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[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - Characterization of surface- and buried-channel detection transistors for CCD on-chip amplifiers

✍ Scribed by Centen, P.G.; Roks, E.

Book ID: 118737430
Publisher: IEEE
Year: 1997
Weight: 268 KB
Edition: 1997
Category: Article
ISBN-13: 9780780341005
DOI: 10.1109/IEDM.1997.650311

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