𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE International Electron Devices Meeting. IEDM Technical Digest - Washington, DC, USA (7-10 Dec. 1997)] International Electron Devices Meeting. IEDM Technical Digest - RF MOSFET modeling accounting for distributed substrate and channel resistances with emphasis on the BSIM3v3 SPICE model

✍ Scribed by Liu, W.; Gharpurey, R.; Chang, M.C.; Erdogan, U.; Aggarwal, R.; Mattia, J.P.

Book ID: 115462711
Publisher: IEEE
Year: 1997
Weight: 392 KB
Volume: 0
Category: Article
ISBN-13: 9780780341005
DOI: 10.1109/iedm.1997.650388

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