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[IEEE International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. - Tunis, Tunisia (2006.09.5-2006.09.7)] International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. - Analysis of multilayer microstrip filter by wave concept iterative process

✍ Scribed by El Amjed, H.; Mohamed, G.; Hichem, T.

Book ID: 115498569
Publisher: IEEE
Year: 2006
Weight: 252 KB
Volume: 0
Category: Article
ISBN-13: 9780780397262
DOI: 10.1109/dtis.2006.1708705

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