𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - AlGaN/GaN heterostructures for UV photodetector applications

✍ Scribed by Boratynski, B.; Paszkiewicz, R.; Paszkiewicz, B.; Jankowski, B.; Tlaczala, M.

Book ID: 126745634
Publisher: IEEE
Year: 2000
Weight: 265 KB
Category: Article
ISBN-13: 9780780359390
DOI: 10.1109/ASDAM.2000.889500

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE International Conference on Advanc

[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - Design and technology of InGaP/GaAs DHBTs

✍ Rezazadeh, A.A.; Sotoodeh, M. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 419 KB

[IEEE International Conference on Advanc

[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - Photoelectric properties of Schottky barriers based on porous silicon

✍ Blynski, V.I.; Lazarouk, S.K.; Malyshev, S.A.; Matskevich, T.P. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 265 KB

[IEEE International Conference on Advanc

[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - Nature of the red photoluminescence in porous silicon

✍ Torchynska, T.V.; Bacarril-Espinosa, G.; Ita-Torre, A.; Palacios Gomez, J.; Kors 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 226 KB

[IEEE International Conference on Advanc

[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - Cathode sputtered permalloy films of high AMR effect and low coercivity

✍ Stangl, G.; Aigner, P.; Hudek, P.; Kostic, I.; Chabicovsky, R.; Hauser, H.; Hoch 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 260 KB

[IEEE International Conference on Advanc

[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - On the measurement of high resistance semiconductors by the van der Pauw method

✍ Morvic, M. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 255 KB

[IEEE International Conference on Advanc

[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - A Raman study of NiO/sub x/ films for gas sensors applications

✍ Srnanek, R.; Hotovy, I.; Malcher, V.; Vincze, A.; McPhail, D.; Littlewood, S. 📂 Article 📅 2000 🏛 IEEE 🌐 English ⚖ 193 KB