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[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - A Raman study of NiO/sub x/ films for gas sensors applications

✍ Scribed by Srnanek, R.; Hotovy, I.; Malcher, V.; Vincze, A.; McPhail, D.; Littlewood, S.

Book ID: 125487519
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 193 KB
Category: Article
ISBN-13: 9780780359390
DOI: 10.1109/ASDAM.2000.889506

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