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[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - On the measurement of high resistance semiconductors by the van der Pauw method

✍ Scribed by Morvic, M.

Book ID: 121837613
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 255 KB
Category: Article
ISBN-13: 9780780359390
DOI: 10.1109/ASDAM.2000.889512

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