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[IEEE International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM) - Smolenice, Slovakia (16-18 Oct. 2000)] ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) - The influence of defect diffusion under electric field on optical and luminescent characteristics of cadmium sulphide

✍ Scribed by Borkovskaya, L.V.; Dzhumaev, B.R.; Khomenkova, L.Yu.; Korsunskaya, N.E.; Markevich, I.V.

Book ID: 117998761
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 293 KB
Volume: 0
Category: Article
ISBN-13: 9780780359390
DOI: 10.1109/asdam.2000.889478

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