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[IEEE ASDAM'02 (4th International Conference on Advanced Semiconductor Devices and Microsystems) - Smolenice Castle, Slovakia (14-16 Oct. 2002)] The Fourth International Conference on Advanced Semiconductor Devices and Microsystem - Synthesis and investigation of nanocrystalline SiC properties in sensor applications

✍ Scribed by Agueev, O.A.; Moskovchenko, N.N.; Svetlichnaya, L.A.

Book ID: 118233450
Publisher: IEEE
Year: 2002
Weight: 144 KB
Volume: 0
Category: Article
ISBN-13: 9780780372764
DOI: 10.1109/asdam.2002.1088474

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