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[IEEE ASDAM'02 (4th International Conference on Advanced Semiconductor Devices and Microsystems) - Smolenice Castle, Slovakia (14-16 Oct. 2002)] The Fourth International Conference on Advanced Semiconductor Devices and Microsystem - Analysis of I-V measurements on Pt/Au-GaN Schottky contacts in a wide temperature range

✍ Scribed by Donoval, D.; Kulikov, V.; Beno, P.; Racko, J.

No coin nor oath required. For personal study only.

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