𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - New approach for risk analysis and management in medical engineering

✍ Scribed by Schmitt, Robert; Zentis, Thomas

Book ID: 126749134
Publisher: IEEE
Year: 2011
Weight: 357 KB
Category: Article
ISBN: 1424488575
DOI: 10.1109/RAMS.2011.5754438

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Advanced models for software reliability prediction

✍ Bluvband, Zigmund; Porotsky, Sergey; Talmor, Michael 📂 Article 📅 2011 🏛 IEEE ⚖ 386 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - A quantitative approach for medical device Health Hazard Analysis

✍ Jiang, Mingxiao; Herzog, Kathy; Pepin, Thomas; Baca, Michael D. 📂 Article 📅 2011 🏛 IEEE ⚖ 483 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Model-driven automated software FMEA

✍ Snooke, Neal; Price, Chris 📂 Article 📅 2011 🏛 IEEE ⚖ 729 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Reliability growth planning for discrete-use systems

✍ Hall, J. Brian 📂 Article 📅 2011 🏛 IEEE ⚖ 563 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - An improved modular approach for dynamic fault tree analysis

✍ Yevkin, Olexandr 📂 Article 📅 2011 🏛 IEEE ⚖ 451 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - An optimization approach for safety instrumented system design

✍ Machleidt, Konstantin; Litz, Lothar 📂 Article 📅 2011 🏛 IEEE ⚖ 402 KB