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[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Scaling, power, and the future of CMOS

✍ Scribed by Horowitz, M.; Alon, E.; Patil, D.; Naffziger, S.; Kumar, R.; Bernstein, K.

Book ID: 126599786
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 381 KB
Category: Article
ISBN-13: 9780780392687
DOI: 10.1109/IEDM.2005.1609253

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