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[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Analysis and implications of ic cooling for deep nanometer scale cmos technologies

✍ Scribed by Sheng-Chih Lin, ; Mahajan, R.; Vivek De, ; Banerjee, K.

Book ID: 120589192
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 643 KB
Category: Article
ISBN-13: 9780780392687
DOI: 10.1109/IEDM.2005.1609537

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