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[IEEE IEEE International Electron Devices Meeting - Washington, DC, USA (5-8 Dec. 1993)] Proceedings of IEEE International Electron Devices Meeting - Three-dimensional "atomistic" simulation of discrete random dopant distribution effects in sub-0.1 μm MOSFET's

✍ Scribed by Hon-Sum Wong, ; Yuan Taur,


Book ID
126014814
Publisher
IEEE
Year
1993
Weight
388 KB
Category
Article
ISBN-13
9780780314504

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