✦ LIBER ✦

[IEEE IEEE International Electron Devices Meeting - Washington, DC, USA (5-8 Dec. 1993)] Proceedings of IEEE International Electron Devices Meeting - Explanation of reverse short channel effect by defect gradients

✍ Scribed by Rafferty, C.S.; Vuong, H.-H.; Eshraghi, S.A.; Giles, M.D.; Pinto, M.R.; Hillenius, S.J.

No coin nor oath required. For personal study only.

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