✦ LIBER ✦

[IEEE IEEE International Electron Devices Meeting - Washington, DC, USA (5-8 Dec. 1993)] Proceedings of IEEE International Electron Devices Meeting - MOSFET reverse short channel effect due to silicon interstitial capture in gate oxide

✍ Scribed by Jacobs, H.; von Schwerin, A.; Scharfetter, D.; Lau, F.

No coin nor oath required. For personal study only.

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