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[IEEE IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) - Pocono Manor, PA, USA (17-20 Oct. 1993)] Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) - Insulator damages related to charge detrapping

✍ Scribed by Le Gressus, C.; Blaise, G.

Book ID: 121761857
Publisher: IEEE
Year: 1993
Weight: 433 KB
Category: Article
ISBN-13: 9780780309661
DOI: 10.1109/CEIDP.1993.378911

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