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[IEEE IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) - Pocono Manor, PA, USA (17-20 Oct. 1993)] Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP '93) - High voltage dielectric response analyser for cable diagnostics

✍ Scribed by Tharning, P.; Werelius, P.; Holmgren, B.; Gafvert, U.

Book ID: 125481428
Publisher: IEEE
Year: 1993
Weight: 245 KB
Category: Article
ISBN-13: 9780780309661
DOI: 10.1109/CEIDP.1993.378884

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