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[IEEE IEEE 1998 International Interconnect Technology Conference - San Francisco, CA, USA (1-3 June 1998)] Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102) - Advanced wiring RC delay issues for sub-0.25-micron generation CMOS

✍ Scribed by Stamper, A.K.; Fuselier, M.B.; Tian, X.

Book ID: 120564800
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 286 KB
Category: Article
ISBN-13: 9780780342859
DOI: 10.1109/IITC.1998.704752

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