𝔖 Bobbio Scriptorium

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[IEEE IEDM 2008. IEEE International Electron Devices Meeting - San Francisco, CA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Characterization and modelling of low-frequency noise in PCM devices

✍ Scribed by Fantini, P.; Betti Beneventi, G.; Calderoni, A.; Larcher, L.; Pavan, P.; Pellizzer, F.

Book ID: 121352941
Publisher: IEEE
Year: 2008
Weight: 651 KB
Category: Article
ISBN: 1424423775
DOI: 10.1109/IEDM.2008.4796656

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