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[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Designing smart temperature sensors in standard CMOS

✍ Scribed by Makinwa, Kofi A. A.

Book ID: 118256132
Publisher: IEEE
Year: 2008
Weight: 93 KB
Volume: 0
Category: Article
ISBN: 1424423775
DOI: 10.1109/iedm.2008.4796714

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