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[IEEE ICSD'98. 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics - Vasteras, Sweden (22-25 June 1998)] ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) - In search of a new method to measure the resistivity of insulating solids

✍ Scribed by Tobazeon, R.; Filippini, J.C.; Marteau, C.

Book ID: 126754034
Publisher: IEEE
Year: 1998
Weight: 354 KB
Category: Article
ISBN-13: 9780780342378
DOI: 10.1109/ICSD.1998.709349

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