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[IEEE ICSD'98. 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics - Vasteras, Sweden (22-25 June 1998)] ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) - Physical modeling of partial discharge patterns

✍ Scribed by Patsch, R.; Hoof, M.

Book ID: 118018875
Publisher: IEEE
Year: 1998
Weight: 397 KB
Volume: 0
Category: Article
ISBN-13: 9780780342378
DOI: 10.1109/icsd.1998.709239

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