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[IEEE ICSD'98. 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics - Vasteras, Sweden (22-25 June 1998)] ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) - Effects of metal impurities in insulation of distribution cables

✍ Scribed by Woo Sun Lee, ; Nam Oh Kim, ; Yong Ho Chung, ; Min Koo Han,

Book ID: 118026124
Publisher: IEEE
Year: 1998
Weight: 283 KB
Volume: 0
Category: Article
ISBN-13: 9780780342378
DOI: 10.1109/icsd.1998.709266

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