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[IEEE ICSD'98. 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics - Vasteras, Sweden (22-25 June 1998)] ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132) - Investigation in to growth of electrical trees in XLPE cables under transient voltages

✍ Scribed by Sarathi, R.; Sridhar, K.

Book ID: 120176974
Publisher: IEEE
Year: 1998
Weight: 322 KB
Category: Article
ISBN-13: 9780780342378
DOI: 10.1109/ICSD.1998.709292

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