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[IEEE Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05) - Buffalo, NY, USA (17-18 Oct. 2005)] Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05) - The Relation between the ROC Curve and the CMC

✍ Scribed by Bolle, R.M.; Connell, J.H.; Pankanti, S.; Ratha, N.K.; Senior, A.W.

Book ID: 120941526
Publisher: IEEE
Year: 2005
Weight: 124 KB
Category: Article
ISBN-13: 9780769524757
DOI: 10.1109/AUTOID.2005.48

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