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[IEEE Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05) - Buffalo, NY, USA (17-18 Oct. 2005)] Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05) - Impact of Singular Point Detection on Fingerprint Matching Performance

✍ Scribed by Chikkerur, S.; Ratha, N.

Book ID: 120655973
Publisher: IEEE
Year: 2005
Weight: 375 KB
Category: Article
ISBN-13: 9780769524757
DOI: 10.1109/AUTOID.2005.34

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