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[IEEE Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05) - Buffalo, NY, USA (17-18 Oct. 2005)] Fourth IEEE Workshop on Automatic Identification Advanced Technologies (AutoID'05) - Impedance Matching Concepts in RFID Transponder Design

✍ Scribed by Rao, K.V.S.; Nikitin, P.V.; Lam, S.F.

Book ID: 111888212
Publisher: IEEE
Year: 2005
Weight: 230 KB
Volume: 0
Category: Article
ISBN-13: 9780769524757
DOI: 10.1109/autoid.2005.35

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