𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Fifth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (1989.02.7-1989.02.9)] Fifth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - A novel circuit for the evaluation of thermal impedance characteristics of MOS integrated circuits

✍ Scribed by Tarter, T.S.

Book ID: 126724074
Publisher: IEEE
Year: 1989
Weight: 360 KB
Category: Article
DOI: 10.1109/STHERM.1989.76078

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