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[IEEE Extended Abstracts of the Fourth International Workshop on Junction Technology - Shanghai, China (15-16 March 2004)] The Fourth International Workshop on Junction Technology, 2004. IWJT '04. - Characteristics of an InP/InGaAs tunneling emitter bipolar transistor (TEBT)

✍ Scribed by Chun-Yuan Chen, ; Chii-Maw Uang, ; Shiou-Ying Cheng, ; Hung-Ming Chuang, ; Ssu-I Fu, ; Ching-Hsiu Tsai, ; Chi-Yuan Chang, ; Wen-Chau Liu,

Book ID: 126667889
Publisher: IEEE
Year: 2004
Weight: 272 KB
Category: Article
ISBN-13: 9780780381919
DOI: 10.1109/IWJT.2004.1306799

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