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[IEEE ESSDERC 2003. 33rd European Solid-State Device Research - ESSDERC '03 - Estoril, Portugal (16-18 Sept. 2003)] Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710) - 45nm gate length Bulk/PD-SOI CMOS transistors with low gate leakage current for high speed and low power applications

✍ Scribed by Yang, C.K.; Chen, T.F.; Liang, C.S.; Chen, T.J.; Chang, T.C.; Cheng, L.W.; Lin, H.S.; Li, G.; Wu, D.Y.; Chen, J.K.; Chien, S.C.; Sun, S.W.; Cheek, J.; Michael, M.; Wu, D.; Fisher, P.; Wristers, D.

Book ID: 121531624
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 224 KB
Category: Article
ISBN-13: 9780780379992
DOI: 10.1109/ESSDERC.2003.1256902

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