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[IEEE Digest of Technical Papers.1990 Symposium on VLSI Technology - Honolulu, Hawaii, USA (1990.06.4-1990.06.7)] Digest of Technical Papers.1990 Symposium on VLSI Technology - A new structural approach for reducing hot carrier generation in deep submicron MOSFETs

✍ Scribed by Tasch, A.F.; Shin, H.; Maziar, C.M.

Book ID: 126749208
Publisher: IEEE
Year: 1990
Weight: 281 KB
Category: Article
DOI: 10.1109/VLSIT.1990.110999

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