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[IEEE Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - Atlanta, GA, USA (8-10 Aug. 1995)] Conference Record AUTOTESTCON '95. 'Systems Readiness: Test Technology for the 21st Century' - Visual reverse engineering using SPNs for automated testing and diagnosis of digital circuits

✍ Scribed by Gattiker, J.; Mertoguno, S.; Moghaddamzadeh, A.; Bourbakis, N.

Book ID: 127288148
Publisher: IEEE
Year: 1995
Weight: 578 KB
Category: Article
ISBN-13: 9780780326217
DOI: 10.1109/autest.1995.522678

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