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[IEEE 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - Salt Lake City, UT, USA (24-27 Aug. 1998)] 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - Reuse of design integration tests for factory testing

✍ Scribed by Dadin, L.E.

Book ID: 120725411
Publisher: IEEE
Year: 1998
Weight: 407 KB
Category: Article
ISBN-13: 9780780344204
DOI: 10.1109/AUTEST.1998.713420

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