𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - Salt Lake City, UT, USA (24-27 Aug. 1998)] 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - RF testing of MEMS components

✍ Scribed by Deakin, D.; DeNatale, J.; Higgins, J.; Mihailovich, R.; Park, S.; Pascal, M.; Richardson, P.; Pollock, G.; Sailer, A.; Sovero, E.; Studer, J.; Sullivan, G.; Tran, L.; Waldrop, J.; Wang, A.; Yao, J.; Anderson, G.; Erlandson, R.

Book ID: 121198577
Publisher: IEEE
Year: 1998
Weight: 81 KB
Category: Article
ISBN-13: 9780780344204
DOI: 10.1109/AUTEST.1998.713438

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1998 IEEE AUTOTESTCON Proceedings.

[IEEE 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - Salt Lake City, UT, USA (24-27 Aug. 1998)] 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - Automated battery charger/analyzer

✍ Girard, S.; Maynard, A.; Tallon, R.; Mains, D.; Darrow, W.; Kempin, B. 📂 Article 📅 1998 🏛 IEEE ⚖ 548 KB

[IEEE 1998 IEEE AUTOTESTCON Proceedings.

[IEEE 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - Salt Lake City, UT, USA (24-27 Aug. 1998)] 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - Reuse of design integration tests for factory testing

✍ Dadin, L.E. 📂 Article 📅 1998 🏛 IEEE ⚖ 407 KB

[IEEE 1998 IEEE AUTOTESTCON Proceedings.

[IEEE 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - Salt Lake City, UT, USA (24-27 Aug. 1998)] 1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179) - Bridging the gap between ATLAS and C: an open-systems approach to TPS re-host

✍ Timcho, T.J. 📂 Article 📅 1998 🏛 IEEE ⚖ 701 KB

[IEEE IMTC/98 Conference Proceedings. IE

[IEEE IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - St. Paul, MN, USA (18-21 May 1998)] IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - Neural network for zero-crossing detection of distorted line voltages in weak AC-systems

✍ Valiviita, S. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 536 KB

[IEEE IMTC/98 Conference Proceedings. IE

[IEEE IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - St. Paul, MN, USA (18-21 May 1998)] IMTC/98 Conference Proceedings. IEEE Instrumentation and Measurement Technology Conference. Where Instrumentation is Going (Cat. No.98CH36222) - Semiquantitative at-line measurement system for multiresidues of pesticide in food based on the ATR spectroscopy

✍ Ishizawa, H.; Matsuzawa, T.; Toba, E. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 362 KB

[IEEE VTC '98. 48th IEEE Vehicular Techn

[IEEE VTC '98. 48th IEEE Vehicular Technology Conference. Pathway to a Global Wireless Revolution - Ottawa, Ont., Canada (18-21 May 1998)] VTC '98. 48th IEEE Vehicular Technology Conference. Pathway to Global Wireless Revolution (Cat. No.98CH36151) - A test system for evaluation of the WCDMA technology

✍ Sundelin, M.; Granzow, W.; Olofsson, H. 📂 Article 📅 1998 🏛 IEEE ⚖ 529 KB