𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Concurrent off-phase built-in self-test of dormant logic

✍ Scribed by Sigal, L.J.; Kime, C.R.

Book ID: 126047752
Publisher: IEEE Comput. Soc. Press
Year: 1988
Weight: 871 KB
Category: Article
ISBN-13: 9780818608704
DOI: 10.1109/TEST.1988.207882

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Comput. Soc. Press International T

[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Practice and theory (IC testing)

✍ McCluskey, E.J. 📂 Article 📅 1988 🏛 IEEE Comput. Soc. Press ⚖ 209 KB

[IEEE Comput. Soc. Press International T

[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Built-in test compiler in an ASIC environment

✍ Archambeau, E.; Van Egmond, K. 📂 Article 📅 1988 🏛 IEEE Comput. Soc. Press ⚖ 467 KB

[IEEE Comput. Soc. Press International T

[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Reliability testing by precise electrical measurement

✍ Dorey, A.P.; Jones, B.K.; Richardson, A.M.; Russell, P.C.; Xu, Y.Z. 📂 Article 📅 1988 🏛 IEEE Comput. Soc. Press ⚖ 383 KB

[IEEE Comput. Soc. Press International T

[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Techniques for user testing of the 68882

✍ Marshall, M. 📂 Article 📅 1988 🏛 IEEE Comput. Soc. Press ⚖ 379 KB

[IEEE Comput. Soc. Press International T

[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Design for test and the cost of quality

✍ Salzmann, C.; Funcell, M.; Taylor, R. 📂 Article 📅 1988 🏛 IEEE Comput. Soc. Press ⚖ 435 KB

[IEEE Comput. Soc. Press International T

[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Integrated pin electronics for a VLSI test system

✍ Branson, C.; Murray, D.; Sullivan, S. 📂 Article 📅 1988 🏛 IEEE Comput. Soc. Press ⚖ 464 KB