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[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Integrated pin electronics for a VLSI test system

✍ Scribed by Branson, C.; Murray, D.; Sullivan, S.

Book ID: 126754253
Publisher: IEEE Comput. Soc. Press
Year: 1988
Weight: 464 KB
Category: Article
ISBN-13: 9780818608704
DOI: 10.1109/TEST.1988.207776

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