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[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Reliability testing by precise electrical measurement

✍ Scribed by Dorey, A.P.; Jones, B.K.; Richardson, A.M.; Russell, P.C.; Xu, Y.Z.

Book ID: 126748415
Publisher: IEEE Comput. Soc. Press
Year: 1988
Weight: 383 KB
Category: Article
ISBN-13: 9780818608704
DOI: 10.1109/TEST.1988.207823

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