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[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - Fault coverage analysis in monitored sequential circuits

✍ Scribed by Parekhji, R.A.; Venkatesh, G.; Sherlekar, S.D.

No coin nor oath required. For personal study only.

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