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[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - A sequential redundant fault identification scheme and its application to test generation

✍ Scribed by Hsing-Chung Liang, ; Chung Len Lee, ; Chen, J.E.

No coin nor oath required. For personal study only.

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