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[IEEE Comput. Soc. Press IEEE 3rd Asian Test Symposium (ATS) - Nara, Japan (15-17 Nov. 1994)] Proceedings of IEEE 3rd Asian Test Symposium (ATS) - Detectability of spurious signals with limited propagation in combinational circuits

✍ Scribed by Moll, F.; Roca, M.; Marche, D.; Rubio, A.

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