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[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Gate sizing: a general purpose optimization approach

✍ Scribed by Coudert, O.

Book ID: 126670637
Publisher: IEEE Comput. Soc. Press
Year: 1996
Weight: 540 KB
Category: Article
ISBN-13: 9780818674235
DOI: 10.1109/EDTC.1996.494151

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