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[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Deterministic pattern generation for weighted random pattern testing

โœ Scribed by Reeb, B.; Wunderlich, H.-J.


Book ID
118143328
Publisher
IEEE Comput. Soc. Press
Year
1996
Weight
705 KB
Volume
0
Category
Article
ISBN-13
9780818674235

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