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[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Deterministic pattern generation for weighted random pattern testing

✍ Scribed by Reeb, B.; Wunderlich, H.-J.

Book ID: 118143328
Publisher: IEEE Comput. Soc. Press
Year: 1996
Weight: 705 KB
Volume: 0
Category: Article
ISBN-13: 9780818674235
DOI: 10.1109/edtc.1996.494124

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