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[IEEE Comput. Soc. Press European Design and Test Conference. ED & TC 97 - Paris, France (17-20 March 1997)] Proceedings European Design and Test Conference. ED & TC 97 - Fast power loss calculation for digital static CMOS circuits

✍ Scribed by Gavrilov, S.; Glebov, A.; Rusakov, S.; Blaauw, D.; Jones, L.; Vijayan, G.

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