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[IEEE Comput. Soc. Press European Design and Test Conference. ED & TC 97 - Paris, France (17-20 March 1997)] Proceedings European Design and Test Conference. ED & TC 97 - A CMOS low-voltage, high-gain op-amp

✍ Scribed by Lu, G.N.; Sou, G.

Book ID: 115546802
Publisher: IEEE Comput. Soc. Press
Year: 1997
Tongue: English
Weight: 559 KB
Volume: 0
Category: Article
ISBN-13: 9780818677861
DOI: 10.1109/edtc.1997.582329

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